Accelerates time-to-market of leading 5G, IoT and automotive electronics
Bangalore, October 23, 2019 – Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that helps enterprises, service providers and governments accelerate innovation to connect and secure the world, announced the PathWave Test 2020 software suite, which delivers an integrated experience for leading electronic manufacturers to accelerate time-to-market of their digital and wireless platforms and products.
Developed on the Keysight PathWave software platform, the PathWave Test 2020 software suite enables 5G, IoT and automotive engineers and managers to streamline test data processing and analysis to speed product introductions and secure a competitive advantage in the market.
PathWave Test 2020 software provides data sharing and management between platform software tools including test automation, advanced measurement, signal creation and generation, as well as data analytics. This integrated software platform allows application-tailored solutions to be developed and deployed to significantly accelerate electronic test workflows and product introductions.
“The digital transformation happening today in engineering enterprises relies on accelerating time-to-market using best in class software and hardware,” said Jay Alexander, chief technology officer at Keysight Technologies. “Keysight’s PathWave Test 2020 software suite reflects our commitment to creating powerful software solutions that help our customers streamline their workflows.”
At the core of the PathWave Test 2020 software suite is PathWave Desktop Edition, providing users with access to the platform for launching and managing applications in the design and test ecosystem.
PathWave Desktop Edition enables engineers to:
- Manage instrument discovery and installed design and test software
- Share data with a common user experience across all design and test software
- Accelerate development and deployment of solutions
- Improve insights leveraging powerful new analytics and best-in-class measurement science
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